US Judge Orders OpenAI to Turn Over Forensic Device Images to Apple in Trade Secret Suit

Apple won a partial motion for expedited discovery against OpenAI in an ongoing lawsuit concerning the alleged theft of trade secrets related to consumer hardware. Judge Edward J. Davila ordered OpenAI to provide forensic device images, summaries of certain employee interviews, and documents outlining former Apple employees’ responsibilities at OpenAI. The judge cited a "valid risk" of evidence destruction, pointing to a conversation between two former Apple employees regarding wiping their Apple-owned electronics. Three former Apple employees, including former hardware chief Tang Yew Tan, were ordered to sit for early depositions. The judge denied Apple's request for expedited discovery into OpenAI’s research on metal finishes, power management, and battery functionality, placing those on a standard timeline. "There’s a valid risk that critical forensic evidence on the devices of engineers that OpenAI poached could be destroyed." — Judge Edward J. Davila.